Principles of astrometry : with special emphasis on long-focus photographic astrometry
San Francisco ; London : W. H. Freeman, c1967
| Campo | Valore |
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| Descrizione | Principles of astrometry : with special emphasis on long-focus photographic astrometry/ Peter van de Kamp. - San Francisco ; London : W. H. Freeman, c1967. - VII, 227 p. : ill. ; 24 cm |
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| ID scheda | 17172 |
| Permalink | https://opac.inaf.it/?ids=17172 |