X-Ray Absorption Spectroscopy of Semiconductors
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015
Abstract/Sommario:
X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their struct ...; [leggi tutto]
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| Descrizione | X-Ray Absorption Spectroscopy of Semiconductors / edited by Claudia S. Schnohr, Mark C. Ridgway. - Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015. - XVI, 361 p. 185 ill., 86 ill. in color ; online resource. - (Springer Series in Optical Sciences ; 190) |
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Introduction to XAS -- Crystalline Semiconductors -- Disordered Semiconductors.- Nanostructures -- Magnetic Semiconductors. - Springer eBooks. - Printed edition: 9783662443613
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| ID scheda | 139472 |
| Permalink | https://opac.inaf.it/?ids=139472 |