Risultati ricerca
Upper Saddle River : Prentice Hall, 2000
Cambridge : Cambridge University Press, 2013
Bellingham : SPIE, c1989
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015
Abstract/Sommario: X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their struct ...; [Leggi tutto...]
Strasbourg : European Science Foundation, 1978
Strasbourg : European Science Foundation, 1979
X-ray and Neutron Reflectivity : Principles and Applications
/ edited by Jean Daillant, Alain Gibaud
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
Abstract/Sommario: Interaction of X-rays (and Neutrons) with Matter -- Statistical Aspects of Wave Scattering at Rough Surfaces -- Specular Reflectivity From Smooth and Rough Surfaces -- Diffuse Scattering -- Neutron Reflectometry -- X-ray Reflectivity by Rough Multilayers -- Grazing Incidence Small Angle X-ray Scattering from Nanostructures -- Index. - This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogic ...; [Leggi tutto...]
Garching bei München : MPE, 1984
Dordrecht ; Boston : Reidel, 1974
[S.l.] : European Space Research Organisation, 1975